Microwave radar for express testing of semiconductor materials

Novickij, Jurij

Use this URL to cite this publication: https://hdl.handle.net/20.500.14911/126295

Microwave radar for express testing of semiconductor materials

Details

Publication Type (CRIS)

Straipsnis konferencijos medžiagoje Web of Science duomenų bazėje / Article in conference proceedings in Web of Science database (P1a1)

Publication Type (eLABa)

Straipsnis konferencijos darbų leidinyje Web of Science DB / Article in conference proceedings Web of Science DB (P1a)

Author(s)

Title

Microwave radar for express testing of semiconductor materials

[en]

Jurij Novickij

Is part of

18th international conference on microwave, radar and wireless communications (MIKON-2010). 4th Microwave and radar week (MRW-2010). Vilnius, Lithuania, June 14-16, 2010 : conference proceedings

Published In

Year	Start Page	End Page
2010	189	190

Publisher

Vilnius : GEOZONDAS Ltd, 2010

Referenced in Database(s)(DBs)

Conference Proceedings Citation Index - Science (Web of Science)

IEEE Xplore

Extent

p. 189-190

URI

URI	Access Rights
https://hdl.handle.net/20.500.14911/126295
Straipsnis	Viso teksto dokumentas (atviroji prieiga) / Full Text Document (Open Access)

Cited references

Science / Art Area

Technologijos mokslai / Technological sciences (T)

Field of Science / Art

Elektros ir elektronikos inžinerija / Electrical and electronic engineering (T001)

Keywords (en)

Abstract (en)

The microwave radar for express testing of semiconductor materials consisting of pulsed magnet, transmitting and receiving antennas, HF generator, pulsed modulator and digital oscilloscope are described. In semiconductor specimen put in pulsed magnetic field a magnetoplasmic wave is excited and propagated through a specimen signal and reference signal delay is measured to find a value of concentration of free charge carriers in semiconductors. Experimental dataof testing of InSb, CdHgTe speciments are presented and an acceptable correspondence of results was achieved.