Use this url to cite publication: https://hdl.handle.net/20.500.14911/122171
Talio sulfidinių sluoksnių tyrimas, panaudojant Ramano sklaidos spektrinę analizę
Publication Type (CRIS)
Straipsnis nerecenzuojamoje Lietuvos konferencijos medžiagoje / Article in non-peer-reviewed Lithuanian conference proceedings (P2c)
Publication Type (eLABa)
Straipsnis nerecenzuotame konferencijos darbų leidinyje / Article in an un-reviewed conference proceedings (P2)
Author(s)
| Author | Affiliation | |
|---|---|---|
Kauno technologijos universitetas | ||
Snitka, Valentinas | Kauno technologijos universitetas | |
Janickis, Vitalijus | Kauno technologijos universitetas |
Title
Talio sulfidinių sluoksnių tyrimas, panaudojant Ramano sklaidos spektrinę analizę
Ingrida Bružaitė, Valentinas Snitka, Vitalijus Janickis
Title in other language
Raman microspectroscopy analysis of thin TlxSy layers
Is part of
Neorganinių junginių chemija ir technologija = Chemistry and technology of inorganic compounds : konferencijos pranešimų medžiaga / Kauno technologijos universitetas
Published In
| Year |
|---|
2010 |
Publisher
Kaunas : Technologija, 2010
Extent
p. 54
Science / Art Area
Gamtos mokslai / Natural Sciences (N)
Field of Science / Art
Chemija / Chemistry (N003)
Abstract (en)
In this work we synthesized the layers of thallium sulfide in the surface of polyethylene film first sulfured in solutions of higher polythionic acid, H2S33O6, and treated with the alkalified solution of thallium(I) sulfate. The phase composition and surface morphology were investigated and fully characterized using X-ray techniques, and different microscopics. The interface of TlXSy film layers was studied with Raman microscope.
Resource Type (COAR)
TextConference outputConference proceedingsConference paper
Language
Lietuvių / Lithuanian (lt)
Country
Lietuva / Lithuania (LT)
Owning collection
ISBN (of the container)
9789955258025
eLABa ID
3053544