Identification of motion parameters from images produced by atomic force microscopy system

Šakytė, Edita; Saunorienė, Loreta; Ragulskis, Minvydas Kazys; Maskeliūnas, Rimas

Use this url to cite publication: https://hdl.handle.net/20.500.14911/120307

Identification of motion parameters from images produced by atomic force microscopy system

Details

Publication Type (CRIS)

Straipsnis Web of Science duomenų bazėje / Article in Web of Science database (S1a)

Publication Type (eLABa)

Straipsnis Web of Science DB / Web of Science DB article (S1)

Author(s)

Author	Affiliation
Šakytė, Edita	Kauno technologijos universitetas
Saunorienė, Loreta	Kauno technologijos universitetas
Ragulskis, Minvydas Kazys	Kauno technologijos universitetas
Maskeliūnas, Rimas	Mechatronikos, robotikos ir skaitmeninės gamybos katedra / Department of Mechatronics, Robotics and Digital Manufacturing (0450)

Title

Identification of motion parameters from images produced by atomic force microscopy system

[en]

Edita Šakytė, Loreta Saunorienė, Minvydas Kazys Ragulskis, Rimas Maskeliūnas

Is part of

Journal of Vibroengineering / Vibromechanika, Lithuanian Academy of Sciences, Kaunas University of Technology, Vilnius Gediminas Technical University

Published In

Year	Volume	Issue	Start Page	End Page
2008	10	2	184	190

Publisher

Vilnius : Vibromechanika

Publisher (trusted)

Vibromechanika

Referenced in Database(s)(DBs)

Academic Search Complete

INSPEC

ISI Web of Science

Extent

p. 184-190

URI

URI
https://hdl.handle.net/20.500.14911/120307

Cited references

Science / Art Area

Technologijos mokslai / Technological sciences (T)

Field of Science / Art

Matavimų inžinerija / Measurement engineering (T010)

Keywords (en)

Abstract (en)

An experimental technique for analysis of pseudo-static oscillations of piezoelectric ceramics is presented in this paper. This technique is capable to detect both transverse and longitudinal oscillations and is based on the formation of observable grating modulated on the static surface of the scanned body. Mathematical and numerical models of the analyzed system comprising a scanning cantilever of atomic force microscope are presented in order to develop an experimental methodology to assess the frequency, transverse and longitudinal amplitudes of elliptic oscillations of the investigated systems.