VILNIUS TECH University Research Management System (CRIS)
Use this url to cite publication: https://hdl.handle.net/20.500.14911/130153

The accuracy of pulsed magnetoplasma interferometer measuring electrical properties of semiconductors

Publication Type (CRIS)
Straipsnis kitame recenzuojamame leidinyje / Article in other peer-reviewed edition (S5)
Publication Type (eLABa)
Straipsnis kitame recenzuotame leidinyje / Article in other peer-reviewed publication (S4)
Author(s)
AuthorAffiliation
Laurinavičius, Laimis  
Elektros inžinerijos katedra / Department of Electrical Engineering (0558)  
Novickij, Jurij  
Elektros inžinerijos katedra / Department of Electrical Engineering (0558)  
Filipavičius, Viktoras  
Elektros inžinerijos katedra / Department of Electrical Engineering (0558)  
Title
The accuracy of pulsed magnetoplasma interferometer measuring electrical properties of semiconductors
[en]
L. Laurinavičius, J. Novickij, V. Filipavičius
Is part of
Measurement science review : journal of the institute of measurement science Slovak academy of sciences
Published In
YearVolumeStart PageEnd Page
2001
1
203
206
Publisher
Bratislava : Institute of Measurement Science
Extent
p. 203-206
URI
URI
https://hdl.handle.net/20.500.14911/130153
Science / Art Area
Technologijos mokslai / Technological sciences (T)
Field of Science / Art
Elektros ir elektronikos inžinerija / Electrical and electronic engineering (T001)
Resource Type (COAR)
TextJournalJournal articleResearch article
Language
Anglų / English (en)
Country
Slovakija / Slovakia (SK)
eLABa ID
3588693