Microwave radar for non-destructive express testing of electrical properties of semiconductor materials

Novickij, Jurij

Use this URL to cite this publication: https://hdl.handle.net/20.500.14911/129632

Microwave radar for non-destructive express testing of electrical properties of semiconductor materials

Details

Publication Type (CRIS)

Straipsnis Web of Science duomenų bazėje / Article in Web of Science database (S1a)

Publication Type (eLABa)

Straipsnis Web of Science DB / Web of Science DB article (S1)

Author(s)

Title

Microwave radar for non-destructive express testing of electrical properties of semiconductor materials

[en]

Jurij Novickij

Is part of

Acta Physica Polonica A

Published In

Year	Volume	Issue	Start Page	End Page
2011	119	4	537	541

Publisher

Warszawa : Polish Academy of Sciences

Publisher (trusted)

Polish Academy of Sciences

Referenced in Database(s)(DBs)

Science Citation Index Expanded (Web of Science)

Extent

p. 537-541

URI

URI	Access Rights
https://hdl.handle.net/20.500.14911/129632
Straipsnis	Viso teksto dokumentas (atviroji prieiga) / Full Text Document (Open Access)

Cited references

Science / Art Area

Technologijos mokslai / Technological sciences (T)

Field of Science / Art

Elektros ir elektronikos inžinerija / Electrical and electronic engineering (T001)

Abstract (en)

Microwave radar for non-destructive express testing of electrical properties of semiconductor materials which consists of pulsed magnet, transmitting and receiving antennas, high frequency generator, pulsed modulator and digital oscilloscope is described. In semiconductor specimen placed in pulsed magnetic field a magnetoplasmic wave is excited and propagated through the specimen. Delay time and attenuation of transmitted and reference signals are measured to find a value of concentration and mobility of free charge carriers in semiconductors. Experimental data of testing of InSb, n-InSb specimens are presented and acceptable for express testing correspondence of results was achieved.