Low-frequency noise, reliability, and quality of high-speed avalanche breakdown detectors

Smetona, Saulius; Matukas, Jonas; Palenskis, Vilius; Olechnovičius, Marius; Kaminskas, Kazys Algirdas; Mallard, Robert

doi:10.1117/12.567498

Use this URL to cite this publication: https://hdl.handle.net/20.500.14911/125013

Low-frequency noise, reliability, and quality of high-speed avalanche breakdown detectors

Details

Publication Type (CRIS)

Straipsnis konferencijos medžiagoje Web of Science duomenų bazėje / Article in conference proceedings in Web of Science database (P1a1)

Publication Type (eLABa)

Straipsnis konferencijos darbų leidinyje Web of Science DB / Article in conference proceedings Web of Science DB (P1a)

Author(s)

Author	Affiliation
Smetona, Saulius	Nortel networks optical components, Ottawa, Canada
Matukas, Jonas	Vilniaus universitetas
Palenskis, Vilius	Vilniaus universitetas
Olechnovičius, Marius	Vilniaus universitetas
Kaminskas, Kazys Algirdas	Statybinių medžiagų ir gaisrinės saugos katedra / Department of Building Materials and Fire Safety (0257)
Mallard, Robert	Nortel networks optical components, Ottawa, Canada

Title

Low-frequency noise, reliability, and quality of high-speed avalanche breakdown detectors

[en]

Saulius Smetona, Jonas Matukas, Vilius Palenskis, Marius Olechnovičius, Kazys Algirdas Kaminskas, Robert Mallard

Is part of

International Conference on Applications of Photonic Technology (Photonics North 2004), Ottawa, Canada, 2014

Published In

Year	Start Page	End Page
2004	834	842

Publisher

Bellingham : SPIE, 2004

Referenced in Database(s)(DBs)

Conference Proceedings Citation Index - Science (Web of Science)

Extent

p. 834-842

URI

URI
https://hdl.handle.net/20.500.14911/125013

DOI

10.1117/12.567498

Cited references

Science / Art Area

Technologijos mokslai / Technological sciences (T)

Field of Science / Art

Statybos inžinerija / Civil engineering (T002)

Fizika / Physics (N002)

Abstract (en)

In this work we investigate the use of low-frequency noise (LFN) spectroscopy as a sensitive tool for investigation of semiconductor avalanche photodiode (APD) quality and reliability for high-speed communication applications. Samples from several manufacturing runs pre-screened through the standard production batch validation showed very low start of life low-frequency noise levels. The LFN test indicates the high quality of the devices with respect to noise characteristics. We also investigated the noise characteristics of production reject devices, some of which exhibit a 1/f type noise peak at the guard ring punch-through voltages, and an increase in noise intensity at punch-through voltages after long term accelerated lifetesting (>1000 h at 200°C and 100 μA)...