Propagation delay times measurements of high-speed digital ICs

Abstract

The new tester for the measurement of the propagation delay times in high-speed digital IC by the use of multi-channel sample head is considered. The multi-channel sample converter is a rather simple device with a small level of internal noise and was developed on the basis of peak detecting sample converter with two quartz generators. The two models of the tester is developed and researched. In testers frequency of recurrence the test pulses the equal 10 MHz, measured times of delays of distribution 0,5 – 50 nanoseconds is established. Time of measurement of one IC makes 0,2 – 1,5 s and depends on amount of measured parameters, and can be reduced up to 10 times. Experimental researches of testers have shown good characteristics of accuracy of measurement, shot-time and long-time stability of results of measurement. The measurement error of propagation delay times does not exceed ± 5%. Time of measurement of one parameter makes 50 ms, without consideration installation time IC. Ill.5, bibl.5 (in English; summaries in Lithuanian, English and Russian).