Analysis of rectangular microstrip structures by the method of moments

Metlevskis, Edvardas; Urbanavičius, Vytautas

Use this URL to cite this publication: https://hdl.handle.net/20.500.14911/126856

Analysis of rectangular microstrip structures by the method of moments

Details

Publication Type (CRIS)

Straipsnis konferencijos medžiagoje Web of Science duomenų bazėje / Article in conference proceedings in Web of Science database (P1a1)

Publication Type (eLABa)

Straipsnis konferencijos darbų leidinyje Web of Science DB / Article in conference proceedings Web of Science DB (P1a)

Author(s)

Author	Affiliation
Metlevskis, Edvardas	Elektroninių sistemų katedra / Department of Electronic Systems (0549)
Urbanavičius, Vytautas	Elektroninių sistemų katedra / Department of Electronic Systems (0549)

Title

Analysis of rectangular microstrip structures by the method of moments

[en]

Edvardas Metlevskis, Vytautas Urbanavičius

Is part of

18th international conference on microwave, radar and wireless communications (MIKON-2010). 4th Microwave and radar week (MRW-2010). Vilnius, Lithuania, June 14-16, 2010 : conference proceedings

Published In

Year	Start Page	End Page
2010	228	231

Publisher

Vilnius : GEOZONDAS Ltd, 2010

Referenced in Database(s)(DBs)

Conference Proceedings Citation Index - Science (Web of Science)

IEEE Xplore

Extent

p. 228-231

URI

URI	Access Rights
https://hdl.handle.net/20.500.14911/126856
Straipsnis	Viso teksto dokumentas (atviroji prieiga) / Full Text Document (Open Access)

Cited references

Science / Art Area

Technologijos mokslai / Technological sciences (T)

Field of Science / Art

Elektros ir elektronikos inžinerija / Electrical and electronic engineering (T001)

Keywords (en)

Abstract (en)

Rectangular microstrip structures (RMS) are widely used in various microwave devices. Using the method of moments and principle of partial images, various techniques are created to determine charge distribution in 2D models of microstrip structures (their cross-section). In this paper, a technique for calculating surface charge distribution and total capacitance of complex 3D rectangular microstrip structures is proposed using the mentioned method and principle. To demonstrate feasibility of the proposed technique, three RMS were investigated. Obtained results are compared with the data published by other researches. Total error is typically less than 5%.